Replacing the sample holder, FIB Control Pannel, Focused-Ion-Beam Nanofabrication Laboratory. B20-1459197 © Javier Larrea
Replacing the sample holder, FIB Control Pannel, Focused-Ion-Beam Nanofabrication Laboratory, Dual-Beam Focused-Ion-Beam FIB, Helios NanoLabTM DualBea...
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Replacing the sample holder, FIB Control Pannel

B20-1459197 © Javier Larrea
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Photographer: Javier Larrea Images & Videos on the website: 63418

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Release information

  • This image has a signed model and property release

Important additional information

  • Please contact us, if you wish to license this image with exclusive rights
  • Image availability cannot be guaranteed until time of purchase.