Stock Photo - Scanning Transmission Electron Microscope TEM/STEM TitanTM G2 60-300 with imaging Cs-corrector is an advanced tool for structural characterization of materials at sub-Angstrom resolution Possessing a broad variety of complementary features, including X-FEG, monochromator, high-resolution Quantum GIF, EDX detector, electron bi-prism and Lorenz lens, this instrument allows to access structure, electronic and magnetic properties, as well as chemical compositions of nano-materials and nano-devices Atomic resolution imaging using TEM, High-Resolution Transmission Electron Microscopy Laboratory HR-TEM, Nano-scale materials characterization CIC nanoGUNE, Nano science Cooperative Research Center, San Sebastian, Donostia, Gipuzkoa, Basque Country, Spain