Stock Photo - Surface Analysis Platform, Surface composition, electronic and geometric structure can be probed by combination of several complimentary spectroscopic and microscopic techniques: X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), Scanning Auger microscopy/Scanning electron microscopy (SAM/SEM), Raman spectroscopy, Near-field scanning optical microscopy (NSOM), Tip enhanced Raman spectroscopy (TERS), Scanning tunnelling microscopy/Atomic force microscopy on air and in liquid, Basque Country, Spain, Europe

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