Photo de stock - Observation of silicon wafer Tencor profilometer Measurement of the refractive index and thickness of monolayers Cleanroom Microelectronics and Microsystems Unit CEIT Center of Studies and Technical Research University of Navarra, Donostia, Gipuzkoa, Basque Country, Spain

Photo de stock: Observation of silicon wafer  Tencor profilometer  Measurement of the refractive index and thickness of monolayers  Cleanroom  Microelectronics and Microsystems.

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