Stock Photo - Inasmet-Tecnalia Foundation, Technology and Research Centre, San Sebastian Technological Park, Basque Country. Atomic Force Microscope (AFM), MultiMode, Model MMAHC-201, Digital Instruments, Veeco, The AFM is a high-resolution scanner

Stock Photo: Inasmet-Tecnalia Foundation, Technology and Research Centre, San Sebastian Technological Park, Basque Country. Atomic Force Microscope (AFM), MultiMode.

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